Transmission Electron Microscope
ARM-200F (JEOL)
Technical manager : Auriane Etienne
Gun : Cold-FEG Electron
Double corrected microscope :
- Probe corrector
- Image corrcetor
Accelerating voltage :
- 120kV
- 200kV
Pole piece : HR (High Resolution)
Detectors :
- HAADF/LAADF/BF
- EDX SDD Centurio (sold angle 1sr)
- GIF Quantum ER Gatan with BF:DF detectors
Accessories ::
- Single tilt specimen holder
- Double tilt analytical specimen holder (tilt +/-35° et +/- 30°)
- Single tilt rotation specimen holder
- Double tilt analytical low temperature specimen holder
- Single tilt straining holder
- Single tilt heating holder
- 360° rotation tomography speciment holder
- Pumping station for specimen holders
- Ion cleaner
