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Transmission Electron Microscope

ARM-200F (JEOL)

Scientific head : Auriane Etienne

 

Gun : Cold-FEG Electron

Double corrected microscope :

  • Probe corrector
  • Image corrcetor

Accelerating voltage :

  • 120kV
  • 200kV

Pole piece : HR (High Resolution)

Detectors :

  • HAADF/LAADF/BF
  • EDX SDD Centurio (sold angle 1sr)
  • GIF Quantum ER Gatan with BF:DF detectors

Accessories ::

  • Single tilt specimen holder
  • Double tilt analytical specimen holder (tilt +/-35° et +/- 30°)
  • Single tilt rotation specimen holder
  • Double tilt analytical low temperature specimen holder
  • Single tilt straining holder
  • Single tilt heating holder
  • 360° rotation tomography speciment holder
  • Pumping station for specimen holders
  • Ion cleaner